发明名称 SEMICONDUCTOR SOCKET AND METHOD OF REPLACING ITS PROBE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor socket capable of saving trouble of exchanging a probe 53 and shortening time required to replace the probe 53. SOLUTION: A semiconductor device having a plurality of external input and output terminals on its bottom surface is provided with a stage 11 to be positioned, a probe 13 to come into contact with the external input and output terminals of the semiconductor device by access of the stage 11, a socket base 14 wherein the probe 13 is stored insertably, on the surface side the stage 11, and a coming-off prevention part 18 detachably provided on the facing surface of the socket base 14 to prevent the probe from coming off. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003347001(A) 申请公布日期 2003.12.05
申请号 JP20020158601 申请日期 2002.05.31
申请人 OKI ELECTRIC IND CO LTD 发明人 KAGAMI SUMIO
分类号 G01R31/26;G01R1/073;H01R13/24;H01R33/76;(IPC1-7):H01R33/76 主分类号 G01R31/26
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