发明名称 DEPOSITED SPACER STRUCTURE AND METHOD OF FORMING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a spacer structure for a stacked layer composed of an electrically conductive layer and a cap layer formed on a semiconductor substrate, wherein the structure has improved electrical isolation and low coupling capacitance. <P>SOLUTION: A spacer structure is deposited on the sidewall of a stacked layer composed of an electrically conductive layer and a cap layer thereon. A dielectric layer composed of a material having a lower dielectric constant than that of silicon nitride is formed covering the semiconductor substrate. Then, a first silicon nitride layer is formed covering the substrate. The first silicon nitride layer and the dielectric layer are sequentially etched so as to form an inner spacer on the sidewall of the stacked layer. A second silicon nitride layer is formed covering the substrate to form an outer spacer on the sidewall of the inner spacer. By forming a deposited spacer structure in which a low-dielectric-constant material is buried, the coupling capacitance generated therein is greatly reduced. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2003347428(A) 申请公布日期 2003.12.05
申请号 JP20020150403 申请日期 2002.05.24
申请人 HUABANG ELECTRONIC CO LTD 发明人 YANG CHIH-HSIEN;CHUANG YUEH-CHENG;SHUE BOR-RU
分类号 H01L21/28;H01L21/768;H01L21/8242;H01L27/108;H01L29/423;H01L29/49 主分类号 H01L21/28
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