| 摘要 |
<P>PROBLEM TO BE SOLVED: To surely enable wire mis-attaching failure detection irrespective of the magnitude of the capacitance of a semiconductor device. <P>SOLUTION: This detecting equipment is provided with: a pulse generator 10 for forming a sharp rectangular waveform; first and second differentiators 11, 12 for differentiating a rectangular waveform delivered from the pulse generator 10; an adder 13 for adding a first output waveform which is obtained from a clamper 7 through a wire 6 by applying a first differentiated waveform of the first differentiator 11 to a semiconductor device 1, and a second differentiated waveform of the second differentiator 12; a delay device 14 for forming a time delay in such a manner that a second differentiated waveform is input in the adder 13 simultaneously to the first output waveform; and a comparator 15 for deciding whether the wire mis-attaching failure exists by comparing the added waveform with a decision level signal 16 at the time of a decision timing signal. <P>COPYRIGHT: (C)2004,JPO |
