发明名称 |
Bad unit marking method for marking bad units/parts on system carriers for mounting chips uses a non-removable bad unit marking distinguished from the surrounding area by its color |
摘要 |
A fine ball grid array component (1) has a system carrier (SC) (2) supporting strip conductors (3) that link contact surfaces (4) on the SC with a connector block (5). A lasting, non-removable bad unit marking (6) distinguished from the surrounding area by its color is used for marking bad units/parts on the SC.
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申请公布号 |
DE10321403(A1) |
申请公布日期 |
2003.12.04 |
申请号 |
DE2003121403 |
申请日期 |
2003.05.12 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
KAHLISCH, KNUT;MIETH, HENNING;UHLMANN, RUEDIGER |
分类号 |
H01L23/00;H01L23/544;H05K1/02;H05K3/00;H05K3/22;H05K3/24;(IPC1-7):G07C3/14;G06K1/12 |
主分类号 |
H01L23/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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