发明名称 Bad unit marking method for marking bad units/parts on system carriers for mounting chips uses a non-removable bad unit marking distinguished from the surrounding area by its color
摘要 A fine ball grid array component (1) has a system carrier (SC) (2) supporting strip conductors (3) that link contact surfaces (4) on the SC with a connector block (5). A lasting, non-removable bad unit marking (6) distinguished from the surrounding area by its color is used for marking bad units/parts on the SC.
申请公布号 DE10321403(A1) 申请公布日期 2003.12.04
申请号 DE2003121403 申请日期 2003.05.12
申请人 INFINEON TECHNOLOGIES AG 发明人 KAHLISCH, KNUT;MIETH, HENNING;UHLMANN, RUEDIGER
分类号 H01L23/00;H01L23/544;H05K1/02;H05K3/00;H05K3/22;H05K3/24;(IPC1-7):G07C3/14;G06K1/12 主分类号 H01L23/00
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