发明名称 Manufacturing process of a semiconductor non-volatile memory cell and corresponding memory cell
摘要 A process for manufacturing a non-volatile memory cell having at least one gate region, the process including the steps of depositing a first dielectric layer onto a semiconductor substrate; depositing a first semiconductor layer onto the first dielectric layer to form a floating gate region of the memory cell; and defining the floating gate region of the memory cell in the first semiconductor layer. The process further includes the step of depositing a second dielectric layer onto the first conductive layer, the second dielectric layer having a higher dielectric constant than 10. Also disclosed is a memory cell integrated in a semiconductor substrate and having a gate region that has a dielectric layer formed over a first conductive layer and having a dielectric constant higher than 10.
申请公布号 US2003224563(A1) 申请公布日期 2003.12.04
申请号 US20020323615 申请日期 2002.12.18
申请人 STMICROELECTRONICS S.R.L. 发明人 ALESSANDRI MAURO;CRIVELLI BARBARA;ZONCA ROMINA
分类号 H01L21/28;H01L29/51;(IPC1-7):H01L21/336 主分类号 H01L21/28
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