发明名称 |
Tungsten plug with conductor capping layer |
摘要 |
Within a method for forming a microelectronic fabrication there is provided a substrate having formed thereover a patterned dielectric layer which defines a via. There is also formed within a lower portion of the via a tungsten.stud layer having a recess thereabove within the via. There is also formed within the recess a patterned conductor capping layer formed of a conductor material other than tungsten. The patterned conductor capping layer may seal a void formed within the tungsten stud layer.
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申请公布号 |
US2003224598(A1) |
申请公布日期 |
2003.12.04 |
申请号 |
US20020161570 |
申请日期 |
2002.06.03 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LEE WEI-CHENG;CHIEN WEN-CHEN;FAN YU-DA;LIU KUO-YEN;CHANG YU-CHING |
分类号 |
H01L21/768;(IPC1-7):H01L21/76;H01L21/44 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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