发明名称 Tungsten plug with conductor capping layer
摘要 Within a method for forming a microelectronic fabrication there is provided a substrate having formed thereover a patterned dielectric layer which defines a via. There is also formed within a lower portion of the via a tungsten.stud layer having a recess thereabove within the via. There is also formed within the recess a patterned conductor capping layer formed of a conductor material other than tungsten. The patterned conductor capping layer may seal a void formed within the tungsten stud layer.
申请公布号 US2003224598(A1) 申请公布日期 2003.12.04
申请号 US20020161570 申请日期 2002.06.03
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LEE WEI-CHENG;CHIEN WEN-CHEN;FAN YU-DA;LIU KUO-YEN;CHANG YU-CHING
分类号 H01L21/768;(IPC1-7):H01L21/76;H01L21/44 主分类号 H01L21/768
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