发明名称 Semiconductor memory device
摘要 A semiconductor memory device having a driver transistor for the supply of electric power is provided, which can diminish leakage current during inactivation while ensuring sufficient power supply capability for a sense amplifier during activation. Gate width is provided at every two bit line pair pitches perpendicularly to a bit line direction, and a supply voltage VDD and a reference voltage VSS are fed to PMOS transistors SP0, SP0_ to SP3, sP3_ and NMOS transistors SN0, SN0_ to SN3, SN3_. In driver-dedicated PMOS transistors P1, P2, and NMOS transistors N1, N2, gate width is adjusted using the length of two bit line pair pitches as a maximum value, while gate length is adjusted using an adjusting region DeltaL, whereby there can be obtained driver-dedicated MOS transistors P1, P2, N1, and N2 in an appropriately adjusted state with respect to such characteristics contrary to each other as ensuring sufficient current supply capability and diminishing a tailing current.
申请公布号 US2003223261(A1) 申请公布日期 2003.12.04
申请号 US20030355079 申请日期 2003.01.31
申请人 FUJITSU LIMITED 发明人 KATO YOSHIHARU;KOMURA KAZUFUMI;KAWAMOTO SATORU
分类号 H01L21/8242;G11C7/06;G11C7/18;G11C8/08;G11C11/401;G11C11/409;H01L27/108;(IPC1-7):G11C7/00;G11C5/06 主分类号 H01L21/8242
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