发明名称 METHOD OF SETTING PARAMETER FOR INSPECTION EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To set parameters optimal for inspection readily. SOLUTION: Any one of an over detection-suppressing mode or a detection mode of not yet detected defects is specified, and when the over detection- suppressing mode is specified, parameters corresponding to the feature amount at false defect parts, not required to be detected, among candidates of defect part are determined and candidates of defect part other than those being detected by these parameters are then extracted. On the other hand, when the detection mode of not yet detected defects is specified, parameters corresponding to the feature amount at defect parts, required to be detected, among candidates of defect part are determined and all defect parts being detected by these parameters are extracted. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003344309(A) 申请公布日期 2003.12.03
申请号 JP20020157141 申请日期 2002.05.30
申请人 OLYMPUS OPTICAL CO LTD 发明人 AKIYAMA SHUJI;ABE MASAHIRO
分类号 G01B11/30;G01N21/956;H01L21/66;(IPC1-7):G01N21/956 主分类号 G01B11/30
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