发明名称 |
INSPECTION METHOD AND DEVICE FOR KEY |
摘要 |
PROBLEM TO BE SOLVED: To perform the inspection of a key 2 in a short time by radiating a linear laser beam L to the surface formed by the irregular faces of a key crest section 2C to determine the quality of the key crest section 2C. SOLUTION: This inspection device for the key 2 has a support means 3 for supporting the key 2 in a vertically raised state, and a radiating means 4 for radiating the linear laser light L toward the surface formed by the irregular faces of the key crest section 2C along the key crest section 2C. The inspection device 1 further comprises a camera 5 for taking the image of the reflected light L' from the surface formed by the irregular faces of the key crest section 2C and a determination means 6 for processing the image of the reflected light L' taken by the camera 5 to determine the quality of the key crest section 2C. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2003344296(A) |
申请公布日期 |
2003.12.03 |
申请号 |
JP20020158733 |
申请日期 |
2002.05.31 |
申请人 |
SHIBUYA KOGYO CO LTD |
发明人 |
MURAMATSU EIICHI;MATSUMURA TAKAYUKI |
分类号 |
E05B19/00;G01B11/24;G01N21/84;(IPC1-7):G01N21/84 |
主分类号 |
E05B19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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