发明名称 SYSTEM FOR INTERLOCKING WAFER HANDLING OPERATION BY DETECTING DEVIATION OF DISC OF ION IMPLANTATION EQUIPMENT
摘要 PURPOSE: A system for interlocking a wafer handling operation by detecting the deviation of a disc of an ion implantation equipment is provided to be capable of reducing the maintenance time of the ion implantation equipment and preventing the generation of a broken wafer. CONSTITUTION: A system for interlocking a wafer handling operation by detecting the deviation of a disc of an ion implantation equipment is provided with a disc(100), a plurality of disc sites(200) having a plurality of pin holes(210,230), installed at the upper portion of the disc for loading a wafer, and a pin assembly(300) having a plurality of pins(315,335), for being moved upward when carrying out a wafer handling operation. The system further includes a wafer handler controller for interlocking the wafer handling operation when the pins contact the disc site.
申请公布号 KR20030091530(A) 申请公布日期 2003.12.03
申请号 KR20020029611 申请日期 2002.05.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HYO JIN;PARK, GEUN BAE
分类号 H01L21/265;(IPC1-7):H01L21/265 主分类号 H01L21/265
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