发明名称 |
SYSTEM FOR INTERLOCKING WAFER HANDLING OPERATION BY DETECTING DEVIATION OF DISC OF ION IMPLANTATION EQUIPMENT |
摘要 |
PURPOSE: A system for interlocking a wafer handling operation by detecting the deviation of a disc of an ion implantation equipment is provided to be capable of reducing the maintenance time of the ion implantation equipment and preventing the generation of a broken wafer. CONSTITUTION: A system for interlocking a wafer handling operation by detecting the deviation of a disc of an ion implantation equipment is provided with a disc(100), a plurality of disc sites(200) having a plurality of pin holes(210,230), installed at the upper portion of the disc for loading a wafer, and a pin assembly(300) having a plurality of pins(315,335), for being moved upward when carrying out a wafer handling operation. The system further includes a wafer handler controller for interlocking the wafer handling operation when the pins contact the disc site.
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申请公布号 |
KR20030091530(A) |
申请公布日期 |
2003.12.03 |
申请号 |
KR20020029611 |
申请日期 |
2002.05.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HYO JIN;PARK, GEUN BAE |
分类号 |
H01L21/265;(IPC1-7):H01L21/265 |
主分类号 |
H01L21/265 |
代理机构 |
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主权项 |
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地址 |
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