发明名称 SELF-TEST CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a self-test circuit that can ensure a CLK input and a test determination output even without an external input from a tester or without a result determination of a tester comparator, and can ensure a UART transmission/reception test. SOLUTION: A semiconductor integrated circuit incorporating a microcomputer comprises a jumper line 15 circulating in a chip, to which jumper line each port circuit is connected via a selector 14. In conformance to port circuits requiring a plurality of lines of input triggers, a plurality of jumper lines 15C and 15D are laid. The jumper lines 15, 15C and 15D are separate. The port circuits comprise a switchable input/output output driver 10 connected to an input data line 13, from which one lead is drawn. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003344499(A) 申请公布日期 2003.12.03
申请号 JP20020154108 申请日期 2002.05.28
申请人 MITSUBISHI ELECTRIC CORP 发明人 KINOSHITA HIROSHI
分类号 G01R31/28;H01L21/822;H01L27/04;(IPC1-7):G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址