发明名称 HANDLING DEVICE AND TESTING DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a handling device that can bring an electronic part into high precision contact with a contact electrode and increase the stability of the electronic part during handling. SOLUTION: The handling device comprises a body part 72 and a holding part 71 supported on the body part 72 to hold an object to be handled, and can at least move the handled object to a target. The handling device further comprises supporting means 73 for supporting the holding part 71 for displacement relative to the body part 72, and latching means 74 for selectively realizing a latching state of restraining displacement of the holding part 71 relative to the body part 72 or an unlatching state of releasing the restraint on displacement of the holding part 71. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003344483(A) 申请公布日期 2003.12.03
申请号 JP20020158996 申请日期 2002.05.31
申请人 FUJITSU LTD 发明人 FUJISHIRO KEIJI;SATOU YASUNORI;MARUYAMA SHIGEYUKI;KOBASHI NAOTO
分类号 G01R31/26;G01R31/28;(IPC1-7):G01R31/26 主分类号 G01R31/26
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