发明名称 DROP IMPACT TESTING MACHINE, AND TESTING METHOD FOR DROP IMPACT TEST
摘要 PROBLEM TO BE SOLVED: To provide accurate setting for a dropping posture and high reproducibility, with regard to a drop impact testing machine used when measuring an impact applied to electronic equipment or the like in dropping. SOLUTION: This impact testing machine comprising a guide shaft A and a frame 11 erected in a base 1, a holder 22 engaged with the guide shaft A and capable of dropping a testing object 3 under the condition where the testing object 3 is mounted, and an impact block 4 provided with an impact sensor 71 and fixed to the base 1 is provided with a pressure governing nozzle 43 provided on an impact face of the impact block 4, and an air pressure control circuit. In the testing machine, air pressure in an upper region of the collision face 41 just before collision is monitored, and air pressure controlled not to bring it into positive pressure and negative pressure. The accurate dropping posture is provided at excellent reproducibility without applying useless stress onto the testing object 3, the very thin and light-weighted electronic equipment is handled as the testing object, and the dropping posture is controlled with the satisfactory reproducibility without being affected by bouyancy generated just before the collision. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003344252(A) 申请公布日期 2003.12.03
申请号 JP20020152590 申请日期 2002.05.27
申请人 NEC CORP 发明人 YOSHIHIRO TAKAAKI;YAMANASHI HIROSHI;KOBAYASHI YOSHIAKI
分类号 G01N3/303;(IPC1-7):G01N3/303 主分类号 G01N3/303
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