发明名称 RESIN FOR CHEMICALLY AMPLIFIED PHOTORESIST COMPOSITION
摘要 <P>PROBLEM TO BE SOLVED: To provide a resin for a chemically amplified photoresist composition. <P>SOLUTION: The polymer has a structure of a unit (II) represented by the chemical formula 166 (wherein R<SP>1</SP>is H or a 1-4C alkyl group; R<SP>2</SP>is a hydroxy group, a 1-8C alkoxy group or a 1-8C thioalkyl group; G is (CH<SB>2</SB>)<SB>n</SB>, O, or S; n is an integer of 0-4; Rc is a lactone group; and m is an integer of 1-3). The polymer exhibits excellent characteristics such as hydrophilicity and dry etching resistance, and is used for manufacturing a chemically amplified photoresist composition. The chemically amplified photoresist composition is used in a lithography process, particularly in a lithography process using a light source of a wavelength of 193 nm and is quite excellent in resolution, profiles and photosensitivity. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2003342323(A) 申请公布日期 2003.12.03
申请号 JP20030134823 申请日期 2003.05.13
申请人 EVERLIGHT USA INC 发明人 CHEN CHI-SHENG;LI YEN-CHENG;CHENG MENG-HSUM
分类号 C08F20/10;C08F220/30;G03F7/039;H01L21/027 主分类号 C08F20/10
代理机构 代理人
主权项
地址