| 摘要 |
PROBLEM TO BE SOLVED: To provide a test capacity which is not or cannot provided by a given ATE (automated test equipment) utilizing various capacities being provided by the ATE. SOLUTION: An IC comprises a first pad (216) arranged as a signal interface to an external component wherein the first pad is provided with a driver (606) and a receiver (614), the driver is arranged to deliver an output signal to the external component of the IC, and the receiver delivers a digital signal in response to a signal received from the external component of the IC. An automatic tester (ATE) (218) and the IC are interconnected electrically and the IC delivers at least one stimulus signal in order to measure the driver strength of the first pad and receives information corresponding to the driver strength of the first pad. COPYRIGHT: (C)2004,JPO
|
