发明名称 MOS transistors having dual gates and self-aligned interconnect contact windows
摘要 A method of fabricating an IC device on a substrate comprising MOS transistors and other IC components. Each of the transistors of the IC device comprises a raised source electrode, a raised drain electrode, dual gate electrodes and self-aligned interconnect contact windows, and is connected to other transistors and other IC components through interconnects formed on top of such self-aligned contact windows.
申请公布号 US6657263(B2) 申请公布日期 2003.12.02
申请号 US20010896205 申请日期 2001.06.28
申请人 MOSEL VITELIC, INC. 发明人 NI CHENG-TSUNG
分类号 H01L21/336;H01L21/768;H01L29/78;(IPC1-7):H01L29/76 主分类号 H01L21/336
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