发明名称 Method for manufacturing semiconductor device
摘要 A method for manufacturing a semiconductor device enables the formation of a well optimized for a fine MOS transistor and a well formed deep with a relatively low concentration for a high voltage MOS transistor without increasing the number of manufacturing steps. The method for manufacturing a semiconductor device includes the steps of: forming a first ion implantation expendable film and an etching mask film on a first conductive type semiconductor substrate; patterning the etching mask film into a shape of an active and field region; introducing dopant into the substrate; forming a trench groove on the substrate; forming an insulation film in the trench groove; forming a first well; flattening the insulation film; removing the etching mask film; removing the expendable film; forming a second ion implantation expendable film on the substrate; forming a mask pattern; and forming a second well by introducing dopant into the substrate.
申请公布号 US6656816(B2) 申请公布日期 2003.12.02
申请号 US20020142700 申请日期 2002.05.10
申请人 UMC JAPAN 发明人 TOMIOKA YUGO
分类号 H01L21/76;H01L21/761;H01L21/762;H01L21/8234;H01L21/8238;H01L27/08;H01L27/092;(IPC1-7):H01L21/76 主分类号 H01L21/76
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