发明名称 Method and X-ray diagnostic installation for correction of comet artifacts
摘要 In an X-ray diagnostic installation and correction method wherein comet artifacts in the unprocessed image can be corrected, a geometrical analysis of the comet artifacts is implemented, an estimated reference value is determined from the original signal using the analysis result, an estimated detail signal is determined from the original signal using the analysis result, and the comet artifacts are corrected on the basis of the estimated reference value and the estimated detail signal.
申请公布号 US6655836(B2) 申请公布日期 2003.12.02
申请号 US20020074981 申请日期 2002.02.13
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 BOEHM STEFAN;SPAHN MARTIN;STOWASSER BORIS
分类号 G01T1/00;A61B6/00;A61B6/02;G03B42/02;G06T1/00;G06T5/00;H04N5/217;(IPC1-7):G01D18/00 主分类号 G01T1/00
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