发明名称 |
Plasma treatment method for fabricating microelectronic fabrication having formed therein conductor layer with enhanced electrical properties |
摘要 |
A method for fabricating a microelectronic fabrication provides for forming a patterned conductor layer into a via defined by a pair of dielectric layers. Within the method, the via is plasma treated prior to forming therein the patterned conductor layer with at least one of: (1) an argon containing plasma with each of a radio frequency source power density and a radio frequency bias power density of less than about 300 watts; and (2) a hydrogen containing plasma with a radio frequency source power of greater than about 400 watts and a radio frequency bias power density of greater than about 100 watts.
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申请公布号 |
US6656832(B1) |
申请公布日期 |
2003.12.02 |
申请号 |
US20020205052 |
申请日期 |
2002.07.25 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD |
发明人 |
PAN SHING-CHYANG;LIN KENG-CHU;JEN SHWANGMING |
分类号 |
H01L21/311;H01L21/768;(IPC1-7):H01L21/476 |
主分类号 |
H01L21/311 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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