发明名称 Plasma treatment method for fabricating microelectronic fabrication having formed therein conductor layer with enhanced electrical properties
摘要 A method for fabricating a microelectronic fabrication provides for forming a patterned conductor layer into a via defined by a pair of dielectric layers. Within the method, the via is plasma treated prior to forming therein the patterned conductor layer with at least one of: (1) an argon containing plasma with each of a radio frequency source power density and a radio frequency bias power density of less than about 300 watts; and (2) a hydrogen containing plasma with a radio frequency source power of greater than about 400 watts and a radio frequency bias power density of greater than about 100 watts.
申请公布号 US6656832(B1) 申请公布日期 2003.12.02
申请号 US20020205052 申请日期 2002.07.25
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD 发明人 PAN SHING-CHYANG;LIN KENG-CHU;JEN SHWANGMING
分类号 H01L21/311;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/311
代理机构 代理人
主权项
地址