| 发明名称 |
Configuration for measurement of internal voltages of an integrated semiconductor apparatus |
| 摘要 |
The invention relates to a configuration for the measurement of internal voltages in a DUT (2), in which a comparator (3) is provided in each DUT (2) and compares the internal voltage (Vint) to be measured with an externally supplied reference voltage (Vref).
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| 申请公布号 |
US6657452(B2) |
申请公布日期 |
2003.12.02 |
| 申请号 |
US20000740633 |
申请日期 |
2000.12.18 |
| 申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
BEER PETER;OHLHOFF CARSTEN |
| 分类号 |
G01R19/165;G01R31/28;(IPC1-7):G01R31/26;G01R31/02 |
主分类号 |
G01R19/165 |
| 代理机构 |
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