发明名称 Graded dielectric layer and method for fabrication thereof
摘要 Within a method for forming a dielectric layer, there is first provided a substrate. There is then formed over the substrate a dielectric layer, wherein the dielectric layer is formed from a dielectric material comprising silicon, carbon and nitrogen. Preferably, a nitrogen content is graded within a thickness of the dielectric layer to provide an upper lying nitrogen rich contiguous surface layer of the dielectric layer and a lower lying nitrogen poor contiguous layer of the dielectric layer. The method contemplates a microelectronic fabrication having formed therein a dielectric layer formed in accord with the method. The method provides the resulting dielectric layer with a lower dielectric constant and enhanced adhesion properties as a substrate layer.
申请公布号 US6657284(B1) 申请公布日期 2003.12.02
申请号 US20000727634 申请日期 2000.12.01
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LI LAIN-JONG;JENG SHWANG-MING;JANG SYUN-MING;YU CHEN-HUA
分类号 H01L21/316;H01L21/768;H01L23/532;(IPC1-7):H01L23/58 主分类号 H01L21/316
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