发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT HAVING THIN FILM RESISTOR
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a manufacturing method for a fine semiconductor integrated circuit having a thin film resistor in which a wiring pattern is formed by dry etching without an additional formation process for a protective film and without needing particular conditions for etching conditions for forming a contact hole. <P>SOLUTION: An electronic circuit component is formed on a semiconductor substrate 11, and a thin film resistor 14 is formed on a USG film 13 on the surface of the component. A BPSG film (interlayer insulating film) 15 for flattening is formed on the thin film resistor 14 and the USG film 13, and contact holes 16, 18 are formed in the BPSG film and in the USG film for exposing the connecting portion of the thin film resistor 14 and a portion for connecting the thin film resistor. A wiring material is formed over the entire surface of the substrate thus obtained, and wiring 19 connected with the thin film resistor 14 is formed by patterning by dry etching. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2003338549(A) 申请公布日期 2003.11.28
申请号 JP20020144123 申请日期 2002.05.20
申请人 NEW JAPAN RADIO CO LTD 发明人 FUKUTOME TAKAO
分类号 H01L21/768;H01L21/3213;H01L21/822;H01L27/04;(IPC1-7):H01L21/822;H01L21/321 主分类号 H01L21/768
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