| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing method and a testing circuit, which enable the user to perform the test of ADC in a time shorter than that in conventional ones, without using a high-precision, high-resolution, and expensive analog voltage generating circuit for an ADC testing circuit. SOLUTION: A potential difference during change of a code can be computed based on an expression 4, by measuring the interval between change times, when a digital output code outputted from the output terminal 25 of an ADC 24 to be tested, without using a high-precision, high-resolution, and expensive voltage-generating circuit for the input voltage to be applied to the input terminal 23 of the ADC 24 to be tested. Therefore, electrical properties can be tested, without using a high-precision, high-resolution, and expensive analog voltage- generating circuit. Furthermore, the waiting time when the high-precision, high- resolution, and expensive voltage generating circuit is can be dispensed with, so the test of the ADC can be performed in a shorter time. COPYRIGHT: (C)2004,JPO
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