| 摘要 |
An X-ray diffraction method for the analysis of polycrystalline materials, the method comprising:(a) providing a polycrystalline material for analysis; (b) providing a polychromatic X-ray source, wherein the source produces X-rays by accelerating charged particles to energies of no more than 1 MeV; (c) collimating X-rays from the polychromatic X-ray source into a beam having a divergence in the range of from 10<-4> to 10<-2> radians;(d) exposing at least a portion of the polycrystalline material to the collimated X-ray beam, whereby the beam is diffracted;(e) collecting at least some of the diffracted X-rays in an energy dispersive X-ray detector or array; and(f) analysing the collected, diffracted X-rays. |
