Testing brittle fracture behavior of chip cards involves subjecting cards to step flexural load so that bending takes place in range of 150 to 180 degrees about their longitudinal or transverse axes

摘要

The method involves subjecting the chip cards (7) to a step flexural load so that bending takes place in a range of 150 to 180 degrees. The chip cards can be bent about their longitudinal axes or about their transverse axes. The step flexural load is applied in a time window of 200 to 1000 ms. The cards are pre-stressed by an element (8) arranged centrally under the card under test. AN Independent claim is also included for the following: (a) a test machine for testing brittle fracture behavior of chip cards.