发明名称 IMPROVED ELECTRODE FOR THIN FILM CAPACITOR DEVICES
摘要 A method of forming a conductor (16) on a substrate (14) including steps of depositing tantalum (22) on a glass layer (20) of the substrate; oxidizing the tantalum; and depositing a noble metal (24) on the oxidized tantalum to form the conductor. The method can be used to form a ferroelectric capacitor (12) or other thin film ferroelectric device. The device can include a substrate comprising a glass layer (20); and an electrode (16) connected to the glass layer. The electrode comprising can include a noble metal (24) connected to the glass layer (20) by an adhesion layer (22) comprising Ta2O5.
申请公布号 WO03098646(A1) 申请公布日期 2003.11.27
申请号 WO2003US14934 申请日期 2003.05.12
申请人 RAYTHEON COMPANY 发明人 DRAB, JOHN, J.;DOUGHERTY, THOMAS, K.;KEHLE, KATHLEEN, A.
分类号 H01L27/105;H01G4/008;H01G4/10;H01G4/33;H01L21/02;H01L21/316;H01L21/8246;(IPC1-7):H01G4/005;H01L21/283 主分类号 H01L27/105
代理机构 代理人
主权项
地址