发明名称 POINT DIFFRACTION INTERFEROMETER USING INCLINED-SECTION OPTICAL FIBER LIGHT SOURCE AND ITS MEASURING METHOD
摘要 <p>Disclosed is a point diffraction interferometer for analyzing the surface profile of an object in a predetermined shape. The present invention relates to a phase-shifting point diffraction interferometer using inclined-section optical fiber light source, which is capable of minimizing a system error by directly using spherical waves emitted from a point beam source as a reference wavefront to move an error caused by a reference surface.</p>
申请公布号 WO2003098194(P1) 申请公布日期 2003.11.27
申请号 KR2002001332 申请日期 2002.07.15
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