发明名称 Semiconductor device and method of manufacturing the same
摘要 There are provided a first insulating film formed over a semiconductor substrate, an adhesion layer formed on the first insulating film and made of titanium oxide having grains a width of which is larger than a height, a capacitor lower electrode formed on the adhesion layer and containing a noble metal, a capacitor dielectric film formed on the capacitor lower electrode and made of ferroelectric material, and a capacitor upper electrode formed on the capacitor dielectric film.
申请公布号 US2003218202(A1) 申请公布日期 2003.11.27
申请号 US20030355172 申请日期 2003.01.31
申请人 FUJITSU LIMITED 发明人 SATO NAOYUKI
分类号 H01L27/105;H01L21/02;H01L21/316;H01L21/8246;H01L27/115;(IPC1-7):H01L27/108 主分类号 H01L27/105
代理机构 代理人
主权项
地址