发明名称 |
MONOLITHIC I-LOAD ARCHITECTURES FOR AUTOMATIC TEST EQUIPMENT |
摘要 |
An active load circuit for automatic test equipment that tests integrated circuits. The active load circuit includes a current source; a current sink; a current switching switching circuit having current source and current sink nodes respectively connected to the current source and the current sink; and to a control circuit for controlling the current switching circuit with a differential voltage that is limited in amplitude and of the same polarity as a voltage difference between a fixed reference voltage and a pin output voltage of a device under test. |
申请公布号 |
WO03098231(A2) |
申请公布日期 |
2003.11.27 |
申请号 |
WO2003US14456 |
申请日期 |
2003.05.09 |
申请人 |
TELASIC COMMUNICATIONS, INC. |
发明人 |
LINDER, LLOYD, F. |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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