| 发明名称 |
MICRO CONNECTOR TO FACILITATE TESTING OF MICRO ELECTRONIC COMPONENT AND SUBASSEMBLIES |
| 摘要 |
A testing apparatus (40) which includes a contact connector comprising a housing (42) with contact blades (43) extending from the housing (42). The contact blades (43) are pivotably mounted to the housing (42) by pivot rods (44). A biasing element (57) coupled to the contact blades (43) providing resistance against rotationof the contact blades (43) in one direction.
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| 申请公布号 |
WO03012927(B1) |
申请公布日期 |
2003.11.27 |
| 申请号 |
WO2002US21776 |
申请日期 |
2002.07.10 |
| 申请人 |
PEMSTAR, INC. |
发明人 |
SCHHUSTER, PHILIP, J.;HAMES, JEFFREY, L.;HILLE, RYAN |
| 分类号 |
H01R13/22;H01R13/24;(IPC1-7):H01R11/18;H01R12/00 |
主分类号 |
H01R13/22 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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