发明名称 |
Scan capable dual edge-triggered state element for application of combinational and sequential scan test patterns |
摘要 |
An apparatus and method of scanning a dual edge-triggered flip-flop with scan capability includes a first scan slave element capable of capturing data on a positive edge of a clock signal; and a second scan slave element capable of capturing data on a negative edge of the clock signal. An apparatus and method of scanning a dual edge-triggered flip-flop with scan capability includes a scan slave element capable of capturing data on either a positive edge or a negative edge of a clock signal; wherein a control signal determines whether the scan slave element captures data on the positive edge or negative edge of the clock signal.
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申请公布号 |
US2003218488(A1) |
申请公布日期 |
2003.11.27 |
申请号 |
US20030444458 |
申请日期 |
2003.05.23 |
申请人 |
PARULKAR ISHWARDUTT;PHAM HA M. |
发明人 |
PARULKAR ISHWARDUTT;PHAM HA M. |
分类号 |
G01R31/3185;(IPC1-7):H03K3/037 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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