发明名称 APPARATUS AND METHOD FOR CONTROLLING THE TEMPERATURE OF AN ELECTRONIC DEVICE UNDER TEST
摘要 An apparatus for controlling the temperature of an electronic device under test includes a thermal head having a temperature controlled surface for making thermal contact with the electronic device. The thermal head defines a flow channel for passage of a refrigerant fluid so as to cause transfer of thermal energy between the electronic device and the thermal head. A refrigeration system is connected in fluid communication with the flow channel of the thermal head to supply refrigerant fluid thereto. The refrigeration system includes a metering valve operative to regulate introduction of the refrigerant fluid into the thermal head. A controller is operative to control the metering valve for maintaining a predetermined temperature at the temperature controlled surface.
申请公布号 US2003217558(A1) 申请公布日期 2003.11.27
申请号 US20010871526 申请日期 2001.05.31
申请人 WALL CHARLES B.;BARNES CYNTHIA M. 发明人 WALL CHARLES B.;BARNES CYNTHIA M.
分类号 G01R31/26;B01L7/00;F25B1/00;F25B41/06;F25D17/02;G01R31/28;G05D23/19;(IPC1-7):F25B41/04 主分类号 G01R31/26
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