| 摘要 |
<p>A method of fault diagnosis of integrated circuits (10) having failing test vectors with observed fault effects (20) using fault candidate fault-effects obtained by simulation of a set of test vectors, comprises determining a fault candidate diagnostic measure for each fault candidate, the fault candidate diagnostic measure having a fault candidate match metric, an observed fault effect mismatch metric, and a fault candidate excitation metric, ranking fault candidates in decreasing diagnostic measure order; and identifying fault candidates having the highest diagnostic measure as the most likely cause of observed fault effects (20).</p> |
