| 摘要 |
FIELD: measurement technology. SUBSTANCE: thermoelectric method of control over thickness of layers of double-layer conductive materials consists in determination of thickness of layer by thermoelectromotive force developed as result of emergence of temperature difference in thickness of layers when one surface of controlled material contacts hot or cold tip. Heads of identical thermocouples enabling temperature in contact points to be measured are used as tips. Additional cold tip in the form of same thermocouple is placed on outer surface of another layer in opposition to hot tip and thickness of one layer is established by values of electromotive forces measured between like electrodes of thermocouples. Thickness of another layer is found as difference of thicknesses of double-layer material and measured layer. EFFECT: diminished measurement error, widened application field of thermoelectric method. 2 dwg
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