发明名称 Transistors including gate dielectric layers having different nitrogen concentrations and related structures
摘要 An electronic device on a semiconductor substrate can include first and second field effect transistors on a substrate. In particular, the first field effect transistor includes a first gate dielectric layer having a first nitrogen concentration, and the second field effect transistor includes a second gate dielectric layer having a second nitrogen concentration lower than the first nitrogen concentration. More particularly, the first field effect transistor can be a PMOS transistor, and the second field effect transistor can be an NMOS transistor. Related methods are also discussed.
申请公布号 US6653180(B2) 申请公布日期 2003.11.25
申请号 US20020140711 申请日期 2002.05.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE TAE-JUNG
分类号 H01L29/78;H01L21/8238;(IPC1-7):H01L21/00 主分类号 H01L29/78
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