发明名称 |
Method and apparatus for linear characterization of multi-terminal single-ended or balanced devices |
摘要 |
A method and apparatus for characterizing a device under test ("DUT") calibrates a multiport test set and measures S-parameters [S] of the DUT. The method and apparatus further involves determining elements of a scalar orthogonal matrix [M] corresponding to terminals of the DUT and DUT modes of operation. The scalar orthogonal matrix [M] comprises a row of elements representing a single-ended terminal of the DUT, and four rows of elements representing a balanced terminal of the DUT. The S-parameters of the DUT are then transformed into mixed-mode S-parameters [Smm] according to Smm=MSM<-1>. A method of and apparatus for characterizing a DUT involves calibrating a multiport test set, coupling the DUT to the multiport test set, and measuring S-parameters of the DUT. The S-parameters are converted to a time domain representation and at least one of the S-parameters is convolved with a simulated input signal to generate an output response. The output response is then displayed.
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申请公布号 |
US6653848(B2) |
申请公布日期 |
2003.11.25 |
申请号 |
US20010954962 |
申请日期 |
2001.09.18 |
申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
ADAMIAN VAHE;PHILLIPS PETER V.;ENQUIST PATRICK J.;COLE J. BRADFORD |
分类号 |
G01R27/28;G01R35/00;(IPC1-7):G01R27/04;G01D18/00;G06F17/10 |
主分类号 |
G01R27/28 |
代理机构 |
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