| 摘要 |
A test pin unit that allows a test-pin replacement at a substantially low cost. The test pin unit has a coil spring, a movable member, a retaining member, and a test pin. The movable member is capable of moving within a predetermined distance along a predetermined reference axis. The coil spring forces the movable member toward the distal end of the predetermined reference axis. The retaining member retains the test pin substantially in parallel to the reference axis in a removable manner and is integrally mounted on the movable member. In addition, the retaining member has a housing part to hold a part of the test pin and at least one screw provided on the periphery of the housing part. The test pin is fixed on the housing part by housing the part of the test pin and then securing the part of the test pin on the housing part by the screw.
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