发明名称 Dynamic slurry distribution control for CMP
摘要 The invention is a slurry distribution system for controlling the distribution of slurry across a top surface of a polishing pad. The polishing pad may be supported by a platen and be part of a polishing station in a chemical mechanical polishing tool. Two juxtaposed perforated manifolds below the polishing pads are used as the primary means of controlling the distribution of slurry. A motor is used to rotate at least one of the perforated manifolds until a desired pattern of aligned perforations below the polishing pad has been achieved. By initially creating the perforations in each manifold in a particular pattern, many different patterns of aligned perforations may be obtained. Patterns may advantageously be made possible that have concentrations of aligned perforations in the center, middle and/or periphery of the manifolds. The polishing pad will have a slurry distribution corresponding to the concentration of aligned perforations in the manifolds.
申请公布号 US6652366(B2) 申请公布日期 2003.11.25
申请号 US20010859656 申请日期 2001.05.16
申请人 SPEEDFAM-IPEC CORPORATION 发明人 DYER TIMOTHY S.
分类号 B24B37/04;B24B57/02;(IPC1-7):B24B1/00 主分类号 B24B37/04
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