| 摘要 |
A scanning microscope is disclosed, through which a sample (14) can be illuminated and detected. An illumination pinhole and a detection pinhole (10, 16) are respectively arranged in the illumination beam path and in the detection beam path (8, 15), an optical component (4), which generates at least to some extent spectrally broadened illumination light, is provided in the illumination beam path (8). A polarization-independent and wavelength-independent beam splitter (11) is arranged in a fixed position in the illumination beam path and the detection beam path (8, 15).
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