发明名称 Delay characteristic analyzing method and delay characteristic analyzing system for a custom LSI
摘要 Circuit blocks each of which is within a predetermined scale are formed based on a read-out net list. Each circuit block is subjected to a dynamic timing analysis, and a delay characteristic library including obtained analysis results is generated. A static timing analysis is performed based on the delay characteristic library. In this manner, the transmission delay of a desired signal path is analyzed in such a manner that the circuit to be analyzed that is indicated by the net list is regarded to be constructed by the above circuit blocks. A delay characteristic analyzing method is provided that can shorten the processing time while maintaining a high degree of freedom of LSI designing and high accuracy of critical path determination in transistor-level full custom LSI designing.
申请公布号 US6654938(B2) 申请公布日期 2003.11.25
申请号 US20010949088 申请日期 2001.09.10
申请人 FUJITSU LIMITED 发明人 KOSUGI KAZUYUKI
分类号 G01R31/28;G06F17/50;(IPC1-7):G06F17/50 主分类号 G01R31/28
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