发明名称 Process for forming deep and shallow insulative regions of an integrated circuit
摘要 Prior fabricating the transistors, a phase of forming a deep insulative trench in the substrate is followed by a phase of forming a shallow insulative trench in the substrate and extending the deep trench. The phase of forming the deep trench includes coating the inside walls of the deep trench with an initial oxide layer and filling the deep trench with silicon inside an envelope formed from an insulative material. The phase of forming the shallow trench includes coating the inside walls of the shallow trench with an initial oxide layer and filling the shallow trench with an insulative material.
申请公布号 US6653182(B2) 申请公布日期 2003.11.25
申请号 US20010898540 申请日期 2001.07.03
申请人 STMICROELECTRONICS S.A. 发明人 MARTY MICHEL;BAUDRY HELENE;LEVERD FRANCOIS
分类号 H01L21/316;H01L21/762;H01L21/763;(IPC1-7):H01L21/823 主分类号 H01L21/316
代理机构 代理人
主权项
地址