发明名称 Interconnection structure and method for fabricating same
摘要 An interconnection structure preferably including one or more conductors that have a central region filled with an insulator, and a method of fabricating such an interconnection structure for preferably making an electrical connection to the conductor(s). The method preferably includes the steps of depositing and patterning a first insulator over a substrate to form an aperture opening to the substrate; depositing and polishing a first conductor to leave the first conductor in the aperture; depositing and patterning a second insulator to form an opening through the second insulator and a recess in the aperture; depositing one or more second conductors to line the opening and the recess, and to form a central region of the interconnection structure; depositing a third insulator to at least partially fill the central region; and making an electrical connection to the second conductor(s).
申请公布号 US6653737(B2) 申请公布日期 2003.11.25
申请号 US20020159181 申请日期 2002.05.31
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HORAK DAVID V.;KLAASEN WILLIAM A.;MCDEVITT THOMAS L.;MURRAY MARK P.;STAMPER ANTHONY K.
分类号 H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L21/768
代理机构 代理人
主权项
地址