| 摘要 |
Scanning probe apparatus, including a tip-electrode which is coupled to be held at a substantially ground potential, a counter-electrode which is positioned in proximity to the tip-electrode, a voltage source, coupled to maintain the counter-electrode at a non-ground potential, and positioning-instrumentation, which is adapted to maintain the tip-electrode at a suitable position relative to a surface of a ferroelectric sample located in a space between the tip-electrode and the counter-electrode. The apparatus generates an electric field in the ferroelectric sample greater than a coercive field of the sample.
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