发明名称 High dielectric constant materials
摘要 A method and structure for an integrated circuit structure that includes introducing precursors on a substrate, oxidizing the precursors and heating the precursors. The introducing and the oxidizing of the precursors is preformed in a manner so as to form an amorphous glass dielectric on the substrate. The process preferably includes, before introducing the precursors on the substrate, cleaning the substrate. The introducing of precursors is performed in molar ratios consistent with formation of glass films and may comprise an atomic level chemical vapor deposition of La2O3 and Al2O3 using ratios between 20%-50% La2O3 and 50%-80%
申请公布号 US6653246(B2) 申请公布日期 2003.11.25
申请号 US20030338481 申请日期 2003.01.08
申请人 发明人
分类号 C23C16/40;C23C16/44;C23C16/455;C23C16/56;H01L21/316;(IPC1-7):H01L21/31;H01L21/469;H01L21/824 主分类号 C23C16/40
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