发明名称 ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide an electron microscope with which even an unskilled person can simply make an astigmatic correction and an axis alignment of electron beams. SOLUTION: After positioning on a light axis a visual field clearly displayable non-points or deviations in axis alignment by a ronchigram, a button of the ronchigram is clicked. When the ronchigram mode is selected, each lens and alignment coil are controlled in imaging conditions for the ronchigram. Further, either a TV camera 28 or 31 is selected and aligned on the light axis with an electron optics system maintained in a mode of a scanning transmission electron microscope. A ronchigram signal is obtained from the TV camera in this condition, and the signal is supplied to a computer 44 through a TV power source 40 and an interface 43 of a transmission electron microscope image. As a result, a ronchigram with a suitable size and brightness is displayed on an image-displaying area 50 of a display device 49, so that an operator makes an astigmatic correction and an adjustment of alignment while observing the ronchigram. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003331773(A) 申请公布日期 2003.11.21
申请号 JP20020137720 申请日期 2002.05.13
申请人 JEOL LTD 发明人 KONDO KOJIN;MATSUSHITA MITSUHIDE;OSAKI MITSUAKI
分类号 H01J37/28;G01Q30/02;G01Q30/04;G21K7/00;H01J37/22;H01J37/244;H01J37/26;(IPC1-7):H01J37/28 主分类号 H01J37/28
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