INPUT BUFFER CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

摘要

PROBLEM TO BE SOLVED: To provide an input buffer circuit and a semiconductor integrated circuit device, capable of measuring a reference voltage at the time of testing without increasing the number of outer terminals for test. SOLUTION: A reference voltage for discriminating level of a signal inputted from the outside is supplied to an input buffer circuit. The circuit is provided with a switch for connecting or disconnecting between a first input terminal to which the signal is inputted and a second input terminal to which the reference voltage is supplied. COPYRIGHT: (C)2004,JPO