发明名称 MANUFACTURING METHOD FOR INSULATED GATE SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a manufacturing method of an insulated gate semiconductor device having superior characteristics. <P>SOLUTION: The manufacturing method of an insulated gate semiconductor device comprises the steps of: forming an amorphous semiconductor film on a glass substrate; forming a mask on the semiconductor film; doping an impurity into the selected portion of the semiconductor film by using the mask; and activating the impurity-doped portion of the semiconductor film through lamp annealing. The lamp annealing is conducted by irradiating the glass substrate with a light of 0.5μm to 4μm from above and from the backside. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2003332351(A) 申请公布日期 2003.11.21
申请号 JP20030120642 申请日期 2003.04.24
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 TAKEMURA YASUHIKO
分类号 G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/336;G02F1/136 主分类号 G02F1/1368
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