发明名称 |
MANUFACTURING METHOD FOR INSULATED GATE SEMICONDUCTOR DEVICE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a manufacturing method of an insulated gate semiconductor device having superior characteristics. <P>SOLUTION: The manufacturing method of an insulated gate semiconductor device comprises the steps of: forming an amorphous semiconductor film on a glass substrate; forming a mask on the semiconductor film; doping an impurity into the selected portion of the semiconductor film by using the mask; and activating the impurity-doped portion of the semiconductor film through lamp annealing. The lamp annealing is conducted by irradiating the glass substrate with a light of 0.5μm to 4μm from above and from the backside. <P>COPYRIGHT: (C)2004,JPO</p> |
申请公布号 |
JP2003332351(A) |
申请公布日期 |
2003.11.21 |
申请号 |
JP20030120642 |
申请日期 |
2003.04.24 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
TAKEMURA YASUHIKO |
分类号 |
G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/336;G02F1/136 |
主分类号 |
G02F1/1368 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|