发明名称 ANNEALING METHOD FOR ALD PROCESS FOR MANUFACTURING METAL INSULATOR METAL FIELD EMISSION DISPLAY
摘要 PURPOSE: An annealing method is provided to overcome an electrical weakness of the Al2O3 dielectric film by performing a post-annealing process on the Al2O3 dielectric film through the use of a low temperature remote plasma. CONSTITUTION: An annealing method comprises a step of depositing an Al2O3 dielectric film and annealing the Al2O3 dielectric film under the oxidative atmosphere using a remote plasma; and a step of depositing an upper electrode and performing an annealing process under a remote plasma atmosphere.
申请公布号 KR20030088904(A) 申请公布日期 2003.11.21
申请号 KR20020026640 申请日期 2002.05.15
申请人 LG ELECTRONICS INC. 发明人 KANG, NAM SEOK;KIM, GWANG YEONG
分类号 H01J1/30;(IPC1-7):H01J1/30 主分类号 H01J1/30
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