发明名称 |
ANNEALING METHOD FOR ALD PROCESS FOR MANUFACTURING METAL INSULATOR METAL FIELD EMISSION DISPLAY |
摘要 |
PURPOSE: An annealing method is provided to overcome an electrical weakness of the Al2O3 dielectric film by performing a post-annealing process on the Al2O3 dielectric film through the use of a low temperature remote plasma. CONSTITUTION: An annealing method comprises a step of depositing an Al2O3 dielectric film and annealing the Al2O3 dielectric film under the oxidative atmosphere using a remote plasma; and a step of depositing an upper electrode and performing an annealing process under a remote plasma atmosphere.
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申请公布号 |
KR20030088904(A) |
申请公布日期 |
2003.11.21 |
申请号 |
KR20020026640 |
申请日期 |
2002.05.15 |
申请人 |
LG ELECTRONICS INC. |
发明人 |
KANG, NAM SEOK;KIM, GWANG YEONG |
分类号 |
H01J1/30;(IPC1-7):H01J1/30 |
主分类号 |
H01J1/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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