发明名称 OPTICAL TECHNIQUE FOR DETECTING BURIED DEFECTS IN OPAQUE FILMS
摘要 A local area of a sample is focally heated to produce a transient physical deformation. The surface of the structure is optically monitored while the heated area cools to a baseline temperature by illuminating the heated region with one or more probe beams from time to time and detecting returning light. In some embodiments heat dissipation within the structure is correlated with change in optical reflectivity over time. In other embodiments, surface deformation of the structure is correlated with changes in light scattering from the surface. Following application of a pump pulse and no more than 3 probe pulses, a time varying returning light signal is compared with a corresponding returning light signal from a reference. An anomaly in the sample is indicated by a deviation between the two signals. First-degree exponential decay curves may be constructed from the signals, and their decay constants compared.
申请公布号 WO03095987(A1) 申请公布日期 2003.11.20
申请号 WO2003US14073 申请日期 2003.05.06
申请人 APPLIED MATERIALS, INC.;APPLIED MATERIALS ISRAEL, LTD. 发明人 SOME, DANIEL, I.
分类号 G01N21/17;G01N21/63;G01N21/956;(IPC1-7):G01N21/17 主分类号 G01N21/17
代理机构 代理人
主权项
地址