| 摘要 |
<p>A microscope system (100) for determining optical properties of a specimen (38) includes a source of polarized (10,22) , a detector (16) for detecting the intensity of light incident thereon, an optical path extending from the source to the detector, a condenser (12) for providing light from the source to the specimen, an objective_lens (14) for receiving light from the specimen, support (15) for mounting the specimen , a sector variable retarder (62, 64, 66) mounted in the optical path, and a polarized light analyzer (28) mounted in the path between the sectored variable retarder and the detector. The variable retarder has a multiple sectors. Each sector is individually addressable by a control signal that effects the light retardation characteristics of the sector.</p> |
